WAVELINE - Roughness and Contour Metrology

Tactile roughness measurement

  • Roughness parameters
  • Core roughness parameters
  • Profile parameters
  • Waviness parameters
  • Motif parameters
  • JIS parameters
  • Topography evaluation
  • Dominant waviness
  • Twist parameters

Tactile roughness measurement

  • Roughness parameters
  • Core roughness parameters
  • Profile parameters
  • Waviness parameters
  • Motif parameters
  • JIS parameters
  • Topography evaluation
  • Dominant waviness
  • Twist parameters

Optical surface inspection

  • Crosshatch angles
  • Area of blowholes
  • Radius
  • Laser honing structures

Surface roughness measurement on a wide range of surfaces

Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct

Wide range of evaluation possibilities in contour measurement

Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct
Jenoptik Waveline Rouaghness and Contour Metrology by Metrology Direct

Roughness measurement

Jenoptik Waveline Rouaghness and Contour Metrology by Metrology Direct

Contour measurement

Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct

Combined roughness and contour measurement

Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct

Surface inspection

Get better measurements

… with versatility

Whether mobile or stationary, manual or automated, for simple or complex measuring tasks – we supply you with measuring systems that are tailored to your needs.

… in day-to-day operations

Our robust and high-precision solutions provide absolutely precise results in environments close to production. Our systems are easy to operate thanks to an intuitive software interface.

… with flexibility

The WAVELINE systems can be optimally configured to suit a wide range of requirements as needed, with exchangeable probe arms and a comprehensive range of accessories. As a result, these systems are also suitable for different measuring tasks on flexible production lines

… with professional metrology

WAVELINE solutions are the direct result of decades of experience and extensive expertise. They stand out from other products on the market thanks to measurements performed in accordance with international standards, simple operation, and professional evaluation of the measured values.

… with modern technology

Mobile WAVELINE solutions feature wireless Bluetooth® technology allowing an almost limitless range of applications. In contour measurement, digital probing systems ensure reliable measurement results without analog limitations.

… with innovative probing systems

Thanks to intelligent probing systems, the correct measuring conditions are automatically set for contour measurements. It is also possible to measure with dual tip probe arms for top/bottom measurements.

Stationary roughness and/or contour measurement with separate probing systems

Hommel-Etamic C800 digital Roughness & Form Measurement

HOMMEL-ETAMIC C8000 digital

Compact and precise contour measuring systems

Hommel-Etamic C800 digiscan Roughness & Form Measurement

HOMMEL-ETAMIC C8000 digiscan

Contour measuring systems with electronic probe arm recognition

Hommel-Etamic T800RC Roughness & Form Measurement

HOMMEL-ETAMIC T8000 RC

Combined roughness and contour systems

Combined roughness and contour measurement with one probing system

Hommel-Etamic surfscan Roughness & Form Measurement

HOMMEL-ETAMIC surfscan

High resolution roughness and contour measurement in one run

Hommel-Etamic nanoscan Roughness & Form Measurement

HOMMEL-ETAMIC nanoscan 855

Simultaneous roughness and contour measurement in the nanometer range

Control and evaluation software for stationary surface measuring systems

Hommel-Etamic Evovis Roughness & Form Software Measurement

HOMMEL-ETAMIC EVOVIS

EVOVIS - evaluation software for roughness and contour

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